IGZO AMeTFT

The backplane solution for the future of premium performance OLED displays

Amorphous Metal Thin Film Transistor technology (AMeTFT) implements innovations in materials and device structure currently in mass production in VLSI to multiply the mobility of any thin film transistor. FinFET gate structure and materials revitalized Moore’s Law for the 21st Century.

Amorphyx applied the foundational concepts of FinFET to revitalize TFT performance - and transition TFT backplanes to flexible substrates. AMeTFT leverages the ultra-smooth surface of amorphous gate metals in uniquely enabling a thin gate insulator for increasing the gate electric field strength. A high-k dielectric oxide is used as the gate insulator to ensure the ability to withstand electric field strengths 5-7 times larger than IGZO or silicon-based TFT gate structures can support. This higher gate electric field dramatically expands the conduction channel in the semiconductor, increasing transconductance and electron mobility.

One of the unique features of IGZO AMeTFT operation is the use of very high gate electric field strength to substantially increase IGZO surface potential (Øs). (See image at right.) This transitions the relationship between carrier density and surface potential from linear to exponential, resulting in the exponential increase in transcendence and field effect mobility with V(GS) unique to IGZO AMeTFT.

The work of Andrew Flewitt’s group at University of Cambridge on the relationships between amorphous metal oxide semiconductor materials science and TFT device physics leads the global academic community. One of the limits on the performance of amorphous metal oxide TFTs in the display industry to date is the relative lack of understanding of these relationships.

This high gate electric field strength puts the IGZO into bulk accumulation mode, maximizing I(DS, sat) and field effect mobility while creating a system incorporating gate insulator, IGZO and etch stop layer for controlling operating stress, field effect mobility, subthreshold swing, and threshold voltage.

Amorphyx has developed fabrication process flows for IGZO AMeTFT incorporating sputtered amorphous metal gate with both reactive sputter and ALD high-k oxide gate insulators. The AMeTFT process flow has been developed to utilize existing deposition equipment, etchants, and photolithography processing.

In addition, amorphous metals are inherently flexible and strong. They are as elastic as the polymer substrates used in flexible displays and electronics while being stronger than steel. Amorphous metals are sputtered at room temperature - ideal for deposition on polymers.

Chart of display resolutions (defined by number of pixels) again the TFT saturation electron mobility performance required to support 60Hz, 120Hz and 240Hz image refresh rates for each resolution. Also shown are the published ranges of saturation electron mobility for single-gate Si, IGZO and LTPS TFT along with single-gate Amorphyx IGZO AMeTFT mobility.

The IGZO TFT enters bulk accumulation as the result of introducing high gate electric field energies to the semiconductor bulk. Above a specific gate-source voltage (V(GS)), the relationship between the surface potential (𝜙(s)) induced by V(GS) and the free carrier density transitions from linear to exponential. Achieving a high surface potential results in bulk accumulation.

(Source: Lee and Nathan, “Conduction Threshold in Accumulation-Mode InGaZnO Thin Film Transistors”, Nature Scientific Reports, 6-22567, Electrical Engineering Division, Department of Engineering, University of Cambridge, 2 March 2016.)

IGZO AMeTFT integrates learnings from FinFET CMOS - the benefits of high gate electric field energy implemented using amorphous gate metals and high-k oxide gate insulators - with two decades of knowledge of amorphous metal oxide semiconductor materials into a device featuring LTPS TFT mobility and stability with extremely low leakage currents. IGZO AMeTFT enables 0.1-240Hz variable image refresh rate performance with amorphous silicon manufacturing complexity.

The IGZO Amorphyx Metal TFT (AMeTFT) technology delivers performance improvement over the display industry’s best TFT - Low Temperature Polysilicon (LTPS) - at 33% of the capital equipment cost..  (LTPS data source:  SHARP, 2021)

Device Performance

IGZO AMeTFT integrates the key features of amorphous IGZO semiconductor materials with the learnings from FinFET CMOS device structures in creating the replacement for LTPS TFTs - high field effect mobility and excellent operating stress status stability.

The family of all-IGZO AMeTFT pixel circuits replaces the manufacturing complexity of the “LTPO” (IGZO+LTPS TFTs) pixel circuit for variable image refresh rate in AMOLED and microLED displays with simplicity similar to that of amorphous silicon.

The benefits of the combination of amorphous gate metal and high-k oxide gate insulator are clear in the chart to the left. A 9x9µm IGZO AMeTFT incorporation 4 combinations of amorphous or crystalline gate metal with aluminum oxide and silicon dioxide gate insulators shows

  • the higher dielectric constant of aluminum oxide relative to silicon dioxide results in higher field effect mobility; and

  • the ultra-smooth amorphous gate metal uniquely improves gate electric field uniformity, reducing charge scattering in the semiconductor channel as gate electric field strength increases (gate insulator thickness is reduced.)

IGZO AMeTFT delivers LTPS-equivalent field effect mobility performance simultaneous with high operating bias stability over temperature (see charts at left). Paired with best-in-class leakage current, IGZO AMeTFT eliminates LTPS TFTs from the AMOLED and microLED backplane technology roadmap.

(Source: “Future of OLED Manufacturing”, Display Supply Chain Consultants, Jan. 2024. Data supplied by Amorphyx.)

Bottom Gate Top Contact TFT Fabrication Process Flow

  • 4 single-tone metal masks

  • all-PVD processing; wet or dry etch

  • S1: Display industry-standard a-IGZO

  • M1: amorphous TiAlx

  • I1, ESL: Al2O3

  • M2: choice of amorphous or crystalline metals

  • <200°C anneals